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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring Kim, Min; Yum, Bong-Jin, JOURNAL OF APPLIED STATISTICS, v.36, no.1, pp.11 - 20, 2009
2	Comparisons of exponential life test plans with intermittent inspections Kim, SH; Yum, Bong-Jin, JOURNAL OF QUALITY TECHNOLOGY, v.32, no.3, pp.217 - 230, 2000-07
3	Planning performance degradation tests - A review Yum, Bong-Jin; Lim, H; Seo, SK, INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v.14, pp.372 - 381, 2007-12

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Kim, Min; Yum, Bong-Jin, JOURNAL OF APPLIED STATISTICS, v.36, no.1, pp.11 - 20, 2009

Kim, SH; Yum, Bong-Jin, JOURNAL OF QUALITY TECHNOLOGY, v.32, no.3, pp.217 - 230, 2000-07

Yum, Bong-Jin; Lim, H; Seo, SK, INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v.14, pp.372 - 381, 2007-12

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