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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Selection between Weibull and lognormal distributions: A comparative simulation study Kim, Jin Seon; Yum, Bong-Jin, COMPUTATIONAL STATISTICS DATA ANALYSIS, v.53, no.2, pp.477 - 485, 2008-12
2	A dual burn-in policy for defect-tolerant memory products using the number of repairs as a quality indicator Tong, SH; Yum, Bong-Jin, MICROELECTRONICS RELIABILITY, v.48, pp.471 - 480, 2008-03

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Kim, Jin Seon; Yum, Bong-Jin, COMPUTATIONAL STATISTICS DATA ANALYSIS, v.53, no.2, pp.477 - 485, 2008-12

Tong, SH; Yum, Bong-Jin, MICROELECTRONICS RELIABILITY, v.48, pp.471 - 480, 2008-03

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