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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Development of a dual burn-in policy for semiconductor products based on the number of defective neighborhood chips Tong S.H.; Yum, Bong-Jin, INTERNATIONAL JOURNAL OF RELIABILITY, QUALITY AND SAFETY ENGINEERING, v.13, no.6, pp.501 - 525, 2006-12 |
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