DSpace at KOASAS
Browsing DSpace

Browse "IE-Journal Papers(저널논문)" by Subject module test

A to Z

All 0-9

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

or enter first few letters:

Showing results 1 to 1 of 1

1
Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment

Cho, Hunsung; Koo, Wonmo; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.3, pp.425 - 433, 2023-08

Discover

Type

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0