Browse "IE-Journal Papers(저널논문)" by Subject convolutional neural network
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| Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks Kyeong, Kiryong; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.31, no.3, pp.395 - 402, 2018-08 |
| Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification Hyun, Yunseung; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11 |
| Playing Behavior Classification of Group-Housed Pigs Using a Deep CNN-LSTM Network Low, Beng Ern; Cho, Yesung; Lee, Bumho; Yi, Mun Yong, SUSTAINABILITY, v.14, no.23, 2022-12 |
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