Browse "IE-Journal Papers(저널논문)" by Author Jeong, Myong K.
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| Comparisons of classification methods in the original and pattern spaces Han, Jeong; Kim, Norman; Jeong, Myong K.; Yum, Bong-Jin, EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.10, pp.12432 - 12438, 2011-09 |
| Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern Han, Jeong; Kim, Norman; Yum, Bong-Jin; Jeong, Myong K., EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.11, pp.13857 - 13862, 2011-10 |
| Robust kernel-based regression with bounded influence for outliers Hwang, Sangheum; Kim, Dohyun; Jeong, Myong K.; Yum, Bong-Jin, JOURNAL OF THE OPERATIONAL RESEARCH SOCIETY, v.66, no.8, pp.1385 - 1398, 2015-08 |
| Robust Kriging models in computer experiments Park, Taejin; Yum, Bong-Jin; Hung, Ying; Jeong, Young-Seon; Jeong, Myong K., JOURNAL OF THE OPERATIONAL RESEARCH SOCIETY, v.67, no.4, pp.644 - 653, 2016-04 |
| Robust Relevance Vector Machine with Variational Inference for Improving Virtual Metrology Accuracy Hwang, Sangheum; Jeong, Myong K.; Yum, Bong-Jin, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.27, no.1, pp.83 - 94, 2014-02 |
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