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AIDING THE OPERATOR DURING NOVEL FAULT-DIAGNOSIS Yoon, Wan Chul; HAMMER, JM, IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, v.18, no.1, pp.142 - 148, 1988-01 |
DEEP-REASONING FAULT-DIAGNOSIS - AN AID AND A MODEL Yoon, Wan Chul; HAMMER, JM, IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, v.18, no.4, pp.659 - 676, 1988-07 |
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