Browse "IE-Journal Papers(저널논문)" by Author Han, Jeong

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Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern

Han, Jeong; Kim, Norman; Yum, Bong-Jin; Jeong, Myong K., EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.11, pp.13857 - 13862, 2011-10

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