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Comparisons of classification methods in the original and pattern spaces Han, Jeong; Kim, Norman; Jeong, Myong K.; Yum, Bong-Jin, EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.10, pp.12432 - 12438, 2011-09 |
Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern Han, Jeong; Kim, Norman; Yum, Bong-Jin; Jeong, Myong K., EXPERT SYSTEMS WITH APPLICATIONS, v.38, no.11, pp.13857 - 13862, 2011-10 |
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