DC Field | Value | Language |
---|---|---|
dc.contributor.author | 이희철 | ko |
dc.contributor.author | 이철 | ko |
dc.contributor.author | 이남영 | ko |
dc.contributor.author | 김재은 | ko |
dc.contributor.author | 박해용 | ko |
dc.contributor.author | 곽동화 | ko |
dc.date.accessioned | 2013-02-25T08:37:36Z | - |
dc.date.available | 2013-02-25T08:37:36Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1994-10 | - |
dc.identifier.citation | 새물리, v.34, no.5, pp.562 - 566 | - |
dc.identifier.issn | 0374-4914 | - |
dc.identifier.uri | http://hdl.handle.net/10203/60885 | - |
dc.language | Korean | - |
dc.publisher | 한국물리학회 | - |
dc.title | 광반사율을 이용한 GaAs:Si의 띠 간격측정 | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.citation.volume | 34 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 562 | - |
dc.citation.endingpage | 566 | - |
dc.citation.publicationname | 새물리 | - |
dc.contributor.localauthor | 이희철 | - |
dc.contributor.localauthor | 김재은 | - |
dc.contributor.localauthor | 박해용 | - |
dc.contributor.nonIdAuthor | 이철 | - |
dc.contributor.nonIdAuthor | 이남영 | - |
dc.contributor.nonIdAuthor | 곽동화 | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.