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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Reliability Modeling and Analysis of Catastrophic Failure and Degradation Data Kim, SH; Kim, DH; Yum, Bong-Jin, International Conference on Industrial Engineering, 2007-11-01 | |
| A new process capability index under multiplicative adjustment of process mean and its demonstration procedures Kim, KW; Yum, Bong-Jin, 2007 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2007, pp.1269 - 1272, 2007-12-02 |
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