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Results 11-20 of 31 (Search time: 0.008 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| A Comparison of Performance Measures for Parameter Design Jung, JR; Lee, PH; Yum, Bong-Jin, 2004 Asia Pacific Management Conference, pp.925 - 932, 2004-10 | |
| Decision Tree Analysis of Process Monitoring Data Kim, SJ; Kim, YS; Yum, Bong-Jin, Asia Pacific Management Conference, pp.95 - 102, 2003-11-01 | |
| Development of Reliability Acceptance Sampling Plans under Accelerated Life Testing and Type II Censoring Kim, SH; Kim, M; Yum, Bong-Jin, International Conference on Computers and Industrial Engineering, pp.1 - 3, 2004-03 | |
| Comparisons of Homogeneity Criteria for Multi-Objective Decision Trees Lee, SH; Kim, DH; Yum, Bong-Jin, Asia Pacific Management Conference, pp.77 - 84, 2003-11 | |
| A Sacalable Clustering Algorithm for Sparse Sequence data Yum, Bong-Jin; Hwang, S, INFORMS Annual Meeting, 2008 | |
| Classification Using the Patterns Generated from the Logical Analysis of Data Yum, Bong-Jin; Han, J; Kim, N; Jeong, MK, APIEMS 2009, pp.1562 - 1569, 2009 | |
| Optimal Design of Accelerated Life Tests under Cyclic-Stress Loading: The Case of Lognormal Lifetime Distribution Yum, Bong-Jin; Kim, SH, APIEMS 2009, pp.1570 - 1577, 2009 | |
| Robust Design with a Functional Response Using a Modified Hausdorff Distance Measure Yum, Bong-Jin; Park, T, APIEMS 2009, pp.1578 - 1584, 2009 | |
| Comparison of Constant- and Step-Stress Accelerated Degradation Test Plans Yum, Bong-Jin; Lim, H, INFORMS Annual Meeting, 2008 | |
| Reliability Modeling and Analysis of Catastrophic Failure and Degradation Data Kim, SH; Kim, DH; Yum, Bong-Jin, International Conference on Industrial Engineering, 2007-11-01 |