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Results 1-10 of 55 (Search time: 0.003 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
A Unified approach to linear programming bounds for queueing networks: Systems with polyhedral invariance of transition probabilities

Morrison, James Rresearcher; Kumar, P. R., IEEE Conference on Decision and Control, IEEE, 2000-12

2
Stability and performance analysis of queueing networks with virtual multiserver stations

Morrison, James Rresearcher; Kumar, P. R., IEEE Conference on Decision and Control, IEEE, 1997-12-10

3
Guaranteed efficiency in closed reentrant networks

Morrison, James Rresearcher; Kumar, P. R., IEEE Conference on Decision and Control, IEEE, 1997-12-10

4
A counterexample to a conjecture of Harrison and Wein

Morrison, James Rresearcher; Kumar, P. R., IEEE conference on Decision and Control, IEEE, 1998-12-16

5
Linear programming performance bounds for Markov chains with polyhedrally translation invariant transition probabilities and applications to unreliable manufacturing systems and enhanced wafer fab models

Morrison, James Rresearcher; Kumar, P. R., Proceedings of IMECE2002, 2002

6
New performance bounds for semiconductor manufacturing plants: batch tools and setups

Morrison, James Rresearcher; Kumar, P. R., IEEE Conference on Decision and Control, IEEE, 1999-12-07

7
Capacity planning and study of scheduling policies using simulation at Motorola's ACT fab

Janakiram, Mani; Morrison, James Rresearcher, Semiconductor Manufacturing Operational Modeling and Simulation, 1999

8
A comparative study of scheduling policies at Motorola fabs

Morrison, James Rresearcher; Janakiram, Mani; Kumar, P. R., SMOMS Conference, 1999

9
New throughput bounds for closed networks

Morrison, James Rresearcher; Kumar, P. R., IEEE Conference on Decision and Control, IEEE, 1999-12-07

10
Cycle time approximations for the G/G/m queue with server failures and constant cycle time offsets with applications

Morrison, James Rresearcher; Martin, Donald, 2006 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, IEEE/SEMI, 2006-05

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