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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Reliability Acceptance Sampling Plans under Accelerated Life Testing and Type II Censoring Yum, Bong-Jin; Kim, SH; Kim, M, International Conference on Computers and Industrial Engineering, 2004 | |
| Development of Reliability Acceptance Sampling Plans under Accelerated Life Testing and Type II Censoring Kim, SH; Kim, M; Yum, Bong-Jin, International Conference on Computers and Industrial Engineering, pp.1 - 3, 2004-03 | |
| Optimal Design of Accelerated Life Tests under Cyclic-Stress Loading: The Case of Lognormal Lifetime Distribution Yum, Bong-Jin; Kim, SH, APIEMS 2009, pp.1570 - 1577, 2009 | |
| Reliability Modeling and Analysis of Catastrophic Failure and Degradation Data Kim, SH; Kim, DH; Yum, Bong-Jin, International Conference on Industrial Engineering, 2007-11-01 |