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Optimal Design of Accelerated Degradation Tests under Step-Stress loading Park, SJ; Yum, Bong-Jin, The 53rd Session of International Statistical Institute, pp.353 - 354, 2001-08 |
Planning Accelerated Tests - A Review (Invited Plenary Lecture) Yum, Bong-Jin; Park, SJ; Lim, HS; Kim, M, 2006 Asian International Workshop on Advanced Reliability Modeling, 2006-08 |
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