Experimental Analysis and Suppression Method of CMOS Latchup Phenomena
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Y.H.Koh | ko |
| dc.contributor.author | C.K.Kim | ko |
| dc.contributor.author | C.M.Kyung | ko |
| dc.date.accessioned | 2013-02-25T07:57:50Z | - |
| dc.date.available | 2013-02-25T07:57:50Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1985-09 | - |
| dc.identifier.citation | 전기학회논문지, v.22, no.5, pp.469 - 475 | - |
| dc.identifier.issn | 1975-8359 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/60662 | - |
| dc.language | Korean | - |
| dc.publisher | 대한전기학회 | - |
| dc.title | Experimental Analysis and Suppression Method of CMOS Latchup Phenomena | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 22 | - |
| dc.citation.issue | 5 | - |
| dc.citation.beginningpage | 469 | - |
| dc.citation.endingpage | 475 | - |
| dc.citation.publicationname | 전기학회논문지 | - |
| dc.contributor.localauthor | C.M.Kyung | - |
| dc.contributor.nonIdAuthor | Y.H.Koh | - |
| dc.contributor.nonIdAuthor | C.K.Kim | - |
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