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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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A Coupled Approach to Developing Damage Prognosis Solutions Farrar, Charles R.; Hemez, Francois; Park, Gyuhae; Robertson, Amy N.; Sohn, Hoon; Williams, Todd O., Key Engineering Materials, Vol.245-246, pp.289-306, 2003 |
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