EFFECTS OF DEPOSITION TEMPERATURE, SAMPLE THICKNESS AND DOPING ON THE MICROSTRUCTURES OF A-SI-H
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | YANG, SH | ko |
| dc.contributor.author | Lee, Choochon | ko |
| dc.date.accessioned | 2013-02-25T01:15:39Z | - |
| dc.date.available | 2013-02-25T01:15:39Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1983 | - |
| dc.identifier.citation | JOURNAL OF NON-CRYSTALLINE SOLIDS, v.59-6, no.DEC, pp.759 - 762 | - |
| dc.identifier.issn | 0022-3093 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/58684 | - |
| dc.language | English | - |
| dc.publisher | ELSEVIER SCIENCE BV | - |
| dc.title | EFFECTS OF DEPOSITION TEMPERATURE, SAMPLE THICKNESS AND DOPING ON THE MICROSTRUCTURES OF A-SI-H | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1983RZ94400026 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 59-6 | - |
| dc.citation.issue | DEC | - |
| dc.citation.beginningpage | 759 | - |
| dc.citation.endingpage | 762 | - |
| dc.citation.publicationname | JOURNAL OF NON-CRYSTALLINE SOLIDS | - |
| dc.identifier.doi | 10.1016/0022-3093(83)90282-X | - |
| dc.contributor.nonIdAuthor | YANG, SH | - |
| dc.type.journalArticle | Article | - |
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