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An Empirical Model for the Threshold Voltage of Enhancement NMOSFETs

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H.J.Park / Kim, Choong Ki
Publisher
IEEE-Inst Electrical Electronics Engineers Inc
Issue Date
1985-10
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, v.4, no.4, pp.629 - 635

ISSN
0278-0070
URI
http://hdl.handle.net/10203/58678
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