Parametric Effects on the Void Fraction Measurement by Capacitance Transducers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chun, Moon Hyun | ko |
| dc.contributor.author | Sung, Chang-Kyung | ko |
| dc.date.accessioned | 2013-02-24T15:22:41Z | - |
| dc.date.available | 2013-02-24T15:22:41Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1986 | - |
| dc.identifier.citation | INTERNATIONAL JOURNAL OF MODELLING AND SIMULATION, v.12, no.4, pp.627 - 640 | - |
| dc.identifier.issn | 0228-6203 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/58211 | - |
| dc.language | English | - |
| dc.publisher | ACTA Press | - |
| dc.title | Parametric Effects on the Void Fraction Measurement by Capacitance Transducers | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1986D977800008 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 12 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 627 | - |
| dc.citation.endingpage | 640 | - |
| dc.citation.publicationname | INTERNATIONAL JOURNAL OF MODELLING AND SIMULATION | - |
| dc.contributor.nonIdAuthor | Sung, Chang-Kyung | - |
| dc.description.isOpenAccess | N | - |
| dc.type.journalArticle | Article | - |
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