PARAMETRIC EFFECTS ON THE LIQUID-FILM-THICKNESS MEASUREMENT BY AN ULTRASONIC METHOD
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chun, Moon Hyun | ko |
| dc.contributor.author | PARK, JR | ko |
| dc.contributor.author | LEE, SK | ko |
| dc.date.accessioned | 2013-02-24T15:13:51Z | - |
| dc.date.available | 2013-02-24T15:13:51Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984 | - |
| dc.identifier.citation | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.46, pp.849 - 850 | - |
| dc.identifier.issn | 0003-018X | - |
| dc.identifier.uri | http://hdl.handle.net/10203/58155 | - |
| dc.language | English | - |
| dc.publisher | AMER NUCLEAR SOC | - |
| dc.title | PARAMETRIC EFFECTS ON THE LIQUID-FILM-THICKNESS MEASUREMENT BY AN ULTRASONIC METHOD | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1984ST80300671 | - |
| dc.identifier.scopusid | 2-s2.0-0021585969 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 46 | - |
| dc.citation.beginningpage | 849 | - |
| dc.citation.endingpage | 850 | - |
| dc.citation.publicationname | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | - |
| dc.contributor.nonIdAuthor | PARK, JR | - |
| dc.contributor.nonIdAuthor | LEE, SK | - |
| dc.type.journalArticle | Meeting Abstract | - |
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