DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chun, Moon Hyun | ko |
dc.contributor.author | CHOI, JB | ko |
dc.date.accessioned | 2013-02-24T14:56:36Z | - |
dc.date.available | 2013-02-24T14:56:36Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985 | - |
dc.identifier.citation | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.50, no.NOV, pp.638 - 640 | - |
dc.identifier.issn | 0003-018X | - |
dc.identifier.uri | http://hdl.handle.net/10203/58043 | - |
dc.language | English | - |
dc.publisher | AMER NUCLEAR SOC | - |
dc.title | PARAMETRIC EFFECTS OF CAPACITANCE TRANSDUCERS ON VOID FRACTION MEASUREMENTS - DYNAMIC TEST-RESULTS | - |
dc.type | Article | - |
dc.identifier.wosid | A1985ATU6900518 | - |
dc.type.rims | ART | - |
dc.citation.volume | 50 | - |
dc.citation.issue | NOV | - |
dc.citation.beginningpage | 638 | - |
dc.citation.endingpage | 640 | - |
dc.citation.publicationname | TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | - |
dc.contributor.nonIdAuthor | CHOI, JB | - |
dc.type.journalArticle | Meeting Abstract | - |
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