PARAMETRIC EFFECTS OF CAPACITANCE TRANSDUCERS ON VOID FRACTION MEASUREMENTS - DYNAMIC TEST-RESULTS

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dc.contributor.authorChun, Moon Hyunko
dc.contributor.authorCHOI, JBko
dc.date.accessioned2013-02-24T14:56:36Z-
dc.date.available2013-02-24T14:56:36Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1985-
dc.identifier.citationTRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.50, no.NOV, pp.638 - 640-
dc.identifier.issn0003-018X-
dc.identifier.urihttp://hdl.handle.net/10203/58043-
dc.languageEnglish-
dc.publisherAMER NUCLEAR SOC-
dc.titlePARAMETRIC EFFECTS OF CAPACITANCE TRANSDUCERS ON VOID FRACTION MEASUREMENTS - DYNAMIC TEST-RESULTS-
dc.typeArticle-
dc.identifier.wosidA1985ATU6900518-
dc.type.rimsART-
dc.citation.volume50-
dc.citation.issueNOV-
dc.citation.beginningpage638-
dc.citation.endingpage640-
dc.citation.publicationnameTRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY-
dc.contributor.nonIdAuthorCHOI, JB-
dc.type.journalArticleMeeting Abstract-
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