CMOS Latch-Up 현상의 실험적 해석 및 그 방지책Experimental Analysis and Suppression Method of CMOS Latch-Up Phenomena
- Publisher
- 대한전자공학회
- Issue Date
- 1985-09
- Language
- Korean
- Citation
전자공학회지, v.22, no.5, pp.50 - 56
- ISSN
- 1975-2377
- Appears in Collection
- Files in This Item
- There are no files associated with this item.
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