CMOS Latch-Up 현상의 실험적 해석 및 그 방지책Experimental Analysis and Suppression Method of CMOS Latch-Up Phenomena

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Publisher
대한전자공학회
Issue Date
1985-09
Language
Korean
Citation

전자공학회지, v.22, no.5, pp.50 - 56

ISSN
1975-2377
URI
http://hdl.handle.net/10203/57850
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