DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Kyung Soo | ko |
dc.date.accessioned | 2013-02-24T13:51:51Z | - |
dc.date.available | 2013-02-24T13:51:51Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985-12 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON RELIABILITY, v.34, no.5, pp.522 - 523 | - |
dc.identifier.issn | 0018-9529 | - |
dc.identifier.uri | http://hdl.handle.net/10203/57597 | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | EFFECT OF BURN-IN ON MEAN RESIDUAL LIFE | - |
dc.type | Article | - |
dc.identifier.wosid | A1985AXB7400028 | - |
dc.type.rims | ART | - |
dc.citation.volume | 34 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 522 | - |
dc.citation.endingpage | 523 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON RELIABILITY | - |
dc.contributor.localauthor | Park, Kyung Soo | - |
dc.type.journalArticle | Article | - |
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