DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Hyungsoo | ko |
dc.contributor.author | Jeong, Youchul | ko |
dc.contributor.author | Park, Joungbae | ko |
dc.contributor.author | Lee, SeokKyu | ko |
dc.contributor.author | Hong, JongKuk | ko |
dc.contributor.author | Hong, Youngsoo | ko |
dc.contributor.author | Kim, Joungho | ko |
dc.date.accessioned | 2007-06-20T07:24:38Z | - |
dc.date.available | 2007-06-20T07:24:38Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2003-12-10 | - |
dc.identifier.citation | IEEE 5th Electronics Packaging Technology Conference, pp.51 - 54 | - |
dc.identifier.uri | http://hdl.handle.net/10203/572 | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE | - |
dc.title | Accurate Measurement of Power/Ground Impedance with Embedded Film Capacitor using Two-port Self-Impedance Measurement Technique | - |
dc.type | Conference | - |
dc.identifier.wosid | 000189435300010 | - |
dc.identifier.scopusid | 2-s2.0-77953594800 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 51 | - |
dc.citation.endingpage | 54 | - |
dc.citation.publicationname | IEEE 5th Electronics Packaging Technology Conference | - |
dc.identifier.conferencecountry | SI | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Kim, Hyungsoo | - |
dc.contributor.nonIdAuthor | Jeong, Youchul | - |
dc.contributor.nonIdAuthor | Park, Joungbae | - |
dc.contributor.nonIdAuthor | Lee, SeokKyu | - |
dc.contributor.nonIdAuthor | Hong, JongKuk | - |
dc.contributor.nonIdAuthor | Hong, Youngsoo | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.