DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Yang-Kyu | - |
dc.contributor.author | Chang, Leland | - |
dc.contributor.author | Yang, Kevin J. | - |
dc.contributor.author | Yeo, Tee-Chia | - |
dc.contributor.author | King, Tsu-Jae | - |
dc.contributor.author | Hu, Chenming | - |
dc.date.accessioned | 2007-06-20T06:43:59Z | - |
dc.date.available | 2007-06-20T06:43:59Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2001-12 | - |
dc.identifier.citation | IEEE, v., no., pp.99 - 102 | - |
dc.identifier.uri | http://hdl.handle.net/10203/564 | - |
dc.description.sponsorship | This research is supported under MARCO contract 2001-MT-887 | en |
dc.language | ENG | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE | - |
dc.title | Reduction of Direct- Tunneling Gate Leakage Current in Double-Gate and Ultra-Thin Body MOSFETs | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 99 | - |
dc.citation.endingpage | 102 | - |
dc.citation.publicationname | IEEE | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Choi, Yang-Kyu | - |
dc.contributor.nonIdAuthor | Chang, Leland | - |
dc.contributor.nonIdAuthor | Yang, Kevin J. | - |
dc.contributor.nonIdAuthor | Yeo, Tee-Chia | - |
dc.contributor.nonIdAuthor | King, Tsu-Jae | - |
dc.contributor.nonIdAuthor | Hu, Chenming | - |
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