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A concavity characterization method for digital objects

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Bajon, J. / Cattoen, M. / Kim, Seong-Daeresearcher
Publisher
ELSEVIER SCIENCE BV
Issue Date
1985-10
Language
English
Article Type
Article
Citation

SIGNAL PROCESSING, v.9, no.3, pp.151 - 161

ISSN
0165-1684
DOI
10.1016/0165-1684(85)90142-2
URI
http://hdl.handle.net/10203/55677
Appears in Collection
EE-Journal Papers(저널논문)
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