반도체 감사공정의 생산성향상 모형A model of productivity improvement for the semiconductor test process
- Advisors
- 김보원researcher; Kim, Bo-Wonresearcher
- Description
- 한국과학기술원 : 테크노경영대학원,
- Publisher
- 한국과학기술원
- Issue Date
- 1999
- Identifier
- 151224/325007 / 000973214
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 테크노경영대학원, 1999.2, [ vii, 98 p. ]
- Keywords
검사공정; 반도체; 생산성향상; Productivity improvement; Test process; Semiconductor
- Appears in Collection
- KGSM-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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