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Browse "Dept. of Chemistry(화학과)" by Subject XPS

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Showing results 1 to 11 of 11

1	Comparative study of the ToF-SIMS, FT-IR and XPS techniques for quantitative analyses of mixed self-assembled monolayers Son, Jin Gyeong; Shon, Hyun Kyong; Choi, Changrok; Han, Sang Woo; Lee, Tae Geol, SURFACE AND INTERFACE ANALYSIS, v.46, pp.110 - 114, 2014-11
2	One-dimensional chain structures produced by Ce on Si(111) Lee, HG; Lee, D; Kim, Sehun; Hwang, C, SURFACE SCIENCE, v.596, no.1-3, pp.39 - 44, 2005-12
3	Role of step roughening in the formation of Ce silicide on Si(111) Lee, HG; Lee, D; Kim, Sehun; Hwang, C, SURFACE SCIENCE, v.579, pp.116 - 122, 2005-04
4	Solid Electrolyte Interphase Revealing Interfacial Electrochemistry on Highly Oriented Pyrolytic Graphite in a Water-in-Salt Electrolyte Kim, Yena; Hong, Misun; Oh, Hyunjeong; Kim, Yousoo; Suyama, Hiroshi; Nakanishi, Shinji; Byon, Hye Ryung, JOURNAL OF PHYSICAL CHEMISTRY C, v.124, no.37, pp.20135 - 20142, 2020-09
5	Structure and thermal behavior of a layered silver carboxylate Lee, SJ; Han, Sang Woo; Choi, HJ; Kim, K, JOURNAL OF PHYSICAL CHEMISTRY B, v.106, no.11, pp.2892 - 2900, 2002-03
6	Surface and pore structures of CMK-5 ordered mesoporous carbons by adsorption and surface spectroscopy Darmstadt, H; Roy, C; Kaliaguine, S; Kim, TW; Ryoo, Ryong, CHEMISTRY OF MATERIALS, v.15, no.17, pp.3300 - 3307, 2003-07
7	Surface chemistry of ordered mesoporous carbons Darmstadt, H; Roy, C; Kaliaguine, S; Choi, SJ; Ryoo, Ryong, CARBON, v.40, no.14, pp.2673 - 2683, 2002
8	Surface etching induced by Ce silicide formation on Si(100) Lee, D; Jeon, SM; Lee, G; Kim, Sehun; Hwang, C; Lee, H, SURFACE SCIENCE, v.601, pp.3823 - 3827, 2007-09
9	Synthesis of single crystalline europium-doped ZnO nanowires Mohanty, P; Kim, Bongsoo; Park, J, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.138, pp.224 - 227, 2007-04
10	Unexpected Li2O2 Film Growth on Carbon Nanotube Electrodes with CeO2 Nanoparticles in Li-O-2 Batteries Yang, Chunzhen; Wong, Raymond A.; Hong, Misun; Yamanaka, Keisuke; Ohta, Toshiaki; Byon, Hye Ryung, NANO LETTERS, v.16, no.5, pp.2969 - 2974, 2016-05
11	Validity of film-thickness estimates based on angle-resolved X-ray photoelectron spectroscopy using various inelastic mean-free-path formulae Lee, H.; Kim, Sehun; Lee, D.; Hwang, C., JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.51, no.6, pp.1915 - 1920, 2007

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