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DEFECT INSPECTION IN SEMICONDUCTOR IMAGES USING HISTOGRAM FITTING AND NEURAL NETWORKS 유진규; 한송희; 이창옥, JOURNAL OF THE KOREAN SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, v.26, no.4, pp.263 - 279, 2022-12 |
Defect inspection in semiconductor images using statistical methods and neural networks = 통계적 방법과 신경망을 이용한 반도체 영상에서 결함 검사link Yu, Jinkyu; Lee, Chang-Ock; et al, 한국과학기술원, 2023 |
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