Showing results 1019 to 1038 of 3690
D-splitting and Hyper-EM for large Bayesian networks of categorical variables Kim, Sung-Ho; Kim, Seong-Ho, The International Institute of Informatics and Systemics, pp.360 - 365, The International Institute of Informatics and Systemics, 2002-07 |
Data association and feature selection with Gaussian processes = 가우시안 확률과정을 이용한 자료연관 기법과 특성 선택 기법link Jeon, Younghwan; Hwang, Ganguk; et al, 한국과학기술원, 2022 |
Data-driven design of thin-film optical systems using deep active learning Hong, Youngjoon; Nicholls, David P., OPTICS EXPRESS, v.30, no.13, pp.22901 - 22910, 2022-06 |
Data-driven simulation modeling, uncertainty quantification, and optimizationlink Kim, Taeho; Kim, Kyoung-Kuk; et al, 2021 |
Data-Efficient Deep Generative Model with Discrete Latent Representation for High- Materials Kim, Namjung; Lee, Dongseok; Hong, Youngjoon, ACS MATERIALS LETTERS, v.5, no.3, pp.730 - 737, 2023-02 |
De Rham-Witt sheaves via algebraic cycles Krishna, Amalendu; Park, Jinhyun, COMPOSITIO MATHEMATICA, v.157, no.10, pp.2089 - 2132, 2021-10 |
Decay rate approximation of queue in packet switched networks Hwang, Gang Uk; Kim, YC; Choi, BD, ELECTRONICS LETTERS, v.37, no.13, pp.864 - 865, 2001-06 |
Deciding whether there are infinitely many prime graphs with forbidden induced subgraphs Brignall, Robert; Choi, Hojin; Jeong, Jisu; Oum, Sang-il, DISCRETE APPLIED MATHEMATICS, v.257, pp.60 - 66, 2019-03 |
Decomposition of places in dihedral and cyclic quintic trinomial extensions of global fields Im, Bo-Hae; Lee, Yoonjin, MANUSCRIPTA MATHEMATICA, v.137, no.1-2, pp.107 - 127, 2012-01 |
Decomposition theorems and fine estimates for electrical fields in the presence of closely located circular inclusions Ammari, Habib; (Kang, Hyeonbae; Lee, Hyundae; Lim, Mikyoung; Zribi, Habib, JOURNAL OF DIFFERENTIAL EQUATIONS, v.247, no.11, pp.2897 - 2912, 2009-12 |
Decompositions of factor codes = 인수함수의 분할에 관한 연구link Lee, In-Je; 이인제; et al, 한국과학기술원, 2010 |
Deep learning application to time-series prediction of daily chlorophyll-a concentration Cho, HyungMin; Choi, U-Jin; Park, Heekyung, WIT Transactions on Ecology and the Environment, v.215, pp.157 - 163, 2018-10 |
Deep learning forecasting using time-varying parameters of the SIRD model for Covid-19 Bousquet, Arthur; Conrad, William H.; Sadat, Said Omer; Vardanyan, Nelli; Hong, Youngjoon, SCIENTIFIC REPORTS, v.12, no.1, 2022-02 |
Deep nonnegative matrix factorization using a variational autoencoder with application to single-cell RNA sequencing data Jee, Dong Jun; Kong, Yixin; Chun, Hyonho, IEEE-ACM TRANSACTIONS ON COMPUTATIONAL BIOLOGY AND BIOINFORMATICS, v.20, no.2, pp.883 - 893, 2023-03 |
Deep nonnegative matrix factorization using a variational autoencoder with application to single-cell RNA sequencing data = 단일 세포 리보핵산 시퀀싱 데이터에 적용되는 변분 오토인코더를 사용한 심층 비음수 행렬 분해link Jee, Dong Jun; Chun, Hyonho; et al, 한국과학기술원, 2022 |
Defect detection of semiconductor wafers using neural networks = 신경망을 이용한 반도체 웨이퍼의 결함 검출link Kim, Seungryul; Lee, Chang-Ock; et al, 한국과학기술원, 2021 |
Defect detection on semiconductor wafers using image processing techniques = 이미지 기술을 이용한 반도체 웨이퍼의 결함 검사link Jeong, Seong Jin; Lee, Chang-Ock; et al, 한국과학기술원, 2020 |
Defect inspection in semiconductor images using FAST-MCD method and neural network Yu, Jinkyu; Han, Songhee; Lee, Chang-Ock, INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.129, no.3-4, pp.1547 - 1565, 2023-11 |
DEFECT INSPECTION IN SEMICONDUCTOR IMAGES USING HISTOGRAM FITTING AND NEURAL NETWORKS 유진규; 한송희; 이창옥, JOURNAL OF THE KOREAN SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, v.26, no.4, pp.263 - 279, 2022-12 |
Defect inspection in semiconductor images using statistical methods and neural networks = 통계적 방법과 신경망을 이용한 반도체 영상에서 결함 검사link Yu, Jinkyu; Lee, Chang-Ock; et al, 한국과학기술원, 2023 |
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