Showing results 1 to 2 of 2
A compact system for simultaneous measurement of linear and angular displacements of nano-stages Kim, JW; Kang, CS; Kim, JA; Eom, T; Cho, M; Kong, Hong-Jin, OPTICS EXPRESS, v.15, pp.15759 - 15766, 2007-11 |
Practical resources and measurements for lossy optical quantum metrology Oh, Changhun; Lee, Su-Yong; Nha, Hyunchul; Jeong, Hyunseok, PHYSICAL REVIEW A, v.96, no.6, 2017-12 |
Discover