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Sub-mu V-rms-Noise Sub-mu W/Channel ADC-Direct Neural Recording With 200-mV/ms Transient Recovery Through Predictive Digital Autoranging Kim, Chul; Joshi, Siddharth; Courellis, Hristos; Wang, Jun; Miller, Cory; Cauwenberghs, Gert, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.53, no.11, pp.3101 - 3110, 2018-11 |
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