Effects of the functional groups of non-conductive films(NCFs) on materials properties and reliability of NCFs flip-chip-on-organic boards플립칩 접속을 위한 비전도성 필름의 관능기가 물질특성 및 신뢰성에 미치는 영향

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dc.contributor.advisorPaik, Kyung-Wook-
dc.contributor.advisor백경욱-
dc.contributor.authorChung, Chang-Kyu-
dc.contributor.author정창규-
dc.date.accessioned2011-12-15T01:47:41Z-
dc.date.available2011-12-15T01:47:41Z-
dc.date.issued2006-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=255422&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/51683-
dc.description학위논문(석사) - 한국과학기술원 : 신소재공학과, 2006.2, [ 76 p. ]-
dc.description.abstractIn this study, effects of the functional groups of non-conductive films (NCFs) on materials properties and reliability of NCFs-bonded flip-chip-on-board (FCOB) assemblies were investigated. The most important issue in NCFs-bonded flip-chip-on-board (FCOB) assemblies is thermal cycling reliability. Thermo-mechanical properties such as glass transition temperature (Tg), modulus (E), and thermal expansion coefficient (CTE) of cured NCFs significantly affect to the thermal cycling reliability of NCFs-bonded FCOB assembly. Therefore, this study has been mainly focused on the improvement of thermo-mechanical properties of NCFs by controlling the number of functional groups of NCFs resin. The functionality modified NCFs-bonded FCOB assembly showed significantly enhanced reliability under thermal cycling test environment. To compare the reliability of conventional and modified NCFs-bonded FCOB assemblies after thermal cycling test, electrical analysis and scanning acoustic microscopy (SAM) investigation were performed. Thermal deformations of each NCFs-bonded FCOB assembly under thermal cycling environment were also investigated and quantitatively compared using high sensitivity Twyman-Green interferometry and Portable Engineering $Moir\acute{e}$ Interferometry (PEMI). According to experimental results, the functional groups of NCFs have great effects on thermo-mechanical properties of cured NCFs, thermal deformations, and thermal cycling reliability of NCFs-bonded FCOB assemblies.eng
dc.languageeng-
dc.publisher한국과학기술원-
dc.subjectInterfacial delamination-
dc.subjectThermal cycling reliability-
dc.subjectThermo-mechanical properties-
dc.subjectFunctional group-
dc.subjectNon-Conductive Films (NCFs)-
dc.subjectThermal deformation-
dc.subject전단 변형-
dc.subject계면 박리-
dc.subject열-싸이클 신뢰성-
dc.subject열-기계적 물성-
dc.subject에폭시 관능기-
dc.subject비전도성 필름-
dc.subjectShear strain-
dc.titleEffects of the functional groups of non-conductive films(NCFs) on materials properties and reliability of NCFs flip-chip-on-organic boards-
dc.title.alternative플립칩 접속을 위한 비전도성 필름의 관능기가 물질특성 및 신뢰성에 미치는 영향-
dc.typeThesis(Master)-
dc.identifier.CNRN255422/325007 -
dc.description.department한국과학기술원 : 신소재공학과, -
dc.identifier.uid020043558-
dc.contributor.localauthorPaik, Kyung-Wook-
dc.contributor.localauthor백경욱-
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MS-Theses_Master(석사논문)
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