DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | Paik, Kyung-Wook | - |
dc.contributor.advisor | 백경욱 | - |
dc.contributor.author | Chung, Chang-Kyu | - |
dc.contributor.author | 정창규 | - |
dc.date.accessioned | 2011-12-15T01:47:41Z | - |
dc.date.available | 2011-12-15T01:47:41Z | - |
dc.date.issued | 2006 | - |
dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=255422&flag=dissertation | - |
dc.identifier.uri | http://hdl.handle.net/10203/51683 | - |
dc.description | 학위논문(석사) - 한국과학기술원 : 신소재공학과, 2006.2, [ 76 p. ] | - |
dc.description.abstract | In this study, effects of the functional groups of non-conductive films (NCFs) on materials properties and reliability of NCFs-bonded flip-chip-on-board (FCOB) assemblies were investigated. The most important issue in NCFs-bonded flip-chip-on-board (FCOB) assemblies is thermal cycling reliability. Thermo-mechanical properties such as glass transition temperature (Tg), modulus (E), and thermal expansion coefficient (CTE) of cured NCFs significantly affect to the thermal cycling reliability of NCFs-bonded FCOB assembly. Therefore, this study has been mainly focused on the improvement of thermo-mechanical properties of NCFs by controlling the number of functional groups of NCFs resin. The functionality modified NCFs-bonded FCOB assembly showed significantly enhanced reliability under thermal cycling test environment. To compare the reliability of conventional and modified NCFs-bonded FCOB assemblies after thermal cycling test, electrical analysis and scanning acoustic microscopy (SAM) investigation were performed. Thermal deformations of each NCFs-bonded FCOB assembly under thermal cycling environment were also investigated and quantitatively compared using high sensitivity Twyman-Green interferometry and Portable Engineering $Moir\acute{e}$ Interferometry (PEMI). According to experimental results, the functional groups of NCFs have great effects on thermo-mechanical properties of cured NCFs, thermal deformations, and thermal cycling reliability of NCFs-bonded FCOB assemblies. | eng |
dc.language | eng | - |
dc.publisher | 한국과학기술원 | - |
dc.subject | Interfacial delamination | - |
dc.subject | Thermal cycling reliability | - |
dc.subject | Thermo-mechanical properties | - |
dc.subject | Functional group | - |
dc.subject | Non-Conductive Films (NCFs) | - |
dc.subject | Thermal deformation | - |
dc.subject | 전단 변형 | - |
dc.subject | 계면 박리 | - |
dc.subject | 열-싸이클 신뢰성 | - |
dc.subject | 열-기계적 물성 | - |
dc.subject | 에폭시 관능기 | - |
dc.subject | 비전도성 필름 | - |
dc.subject | Shear strain | - |
dc.title | Effects of the functional groups of non-conductive films(NCFs) on materials properties and reliability of NCFs flip-chip-on-organic boards | - |
dc.title.alternative | 플립칩 접속을 위한 비전도성 필름의 관능기가 물질특성 및 신뢰성에 미치는 영향 | - |
dc.type | Thesis(Master) | - |
dc.identifier.CNRN | 255422/325007 | - |
dc.description.department | 한국과학기술원 : 신소재공학과, | - |
dc.identifier.uid | 020043558 | - |
dc.contributor.localauthor | Paik, Kyung-Wook | - |
dc.contributor.localauthor | 백경욱 | - |
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