Atomic force microscope를 이용한 탐침 정보 저장용 PZT 박막의 조성에 따른 도메인 특성 분석Domain characterization of PZT thin films using atomic force microscope for probe based data storage

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Advisors
노광수researcher배병수researcherNo, Kwang-SooresearcherBae, Byeong-Sooresearcher
Description
한국과학기술원 : 신소재공학과,
Publisher
한국과학기술원
Issue Date
2004
Identifier
238314/325007  / 020023125
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 신소재공학과, 2004.2, [ ix, 69 p. ]

Keywords

PZT; 조성; 도메인; PROBE BASED DATA STORAGE; ATOMIC FORCE MICROSCOPE; PZT; COMPOSITION; DOMAIN; 탐침 정보 저장 장치; 원자력 현미경

URI
http://hdl.handle.net/10203/51600
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=238314&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
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