CdTe 화합물 반도체 에피층의 성장과 결함에 대한 전자현미경 연구Electron microscopy studies on the epitaxial growth and defects of CdTe compound semiconductors
- Advisors
- 이정용researcher; Lee, Jeong-Yongresearcher
- Description
- 한국과학기술원 : 재료공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1997
- Identifier
- 113130/325007 / 000953094
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 재료공학과, 1997.2, [ ii, 86 p. ]
- Keywords
전자 현미경; 결함; 에피 성장; 화합물 반도체; CdTe; Electron microscopy; Defects; Epitaxial growth; Hillock
- Appears in Collection
- MS-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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