DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 이원종 | - |
dc.contributor.advisor | Lee, Won-Jong | - |
dc.contributor.author | 이강운 | - |
dc.contributor.author | Lee, Kang-Woon | - |
dc.date.accessioned | 2011-12-15T01:04:53Z | - |
dc.date.available | 2011-12-15T01:04:53Z | - |
dc.date.issued | 2003 | - |
dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=181098&flag=dissertation | - |
dc.identifier.uri | http://hdl.handle.net/10203/50293 | - |
dc.description | 학위논문(박사) - 한국과학기술원 : 재료공학과, 2003.2, [ vi, 148 p. ] | - |
dc.language | kor | - |
dc.publisher | 한국과학기술원 | - |
dc.subject | PZT | - |
dc.subject | 강유전체 | - |
dc.subject | 신뢰성 | - |
dc.subject | FRAM | - |
dc.subject | depolarization | - |
dc.subject | size effect | - |
dc.subject | imprint | - |
dc.title | 고집적 DRO FRAM 소자용 PZT 박막 캐패시터의 신뢰성 연구 | - |
dc.title.alternative | Reliability study in PZT thin film capacitors for high-density DRO FRAM devices | - |
dc.type | Thesis(Ph.D) | - |
dc.identifier.CNRN | 181098/325007 | - |
dc.description.department | 한국과학기술원 : 재료공학과, | - |
dc.identifier.uid | 000995255 | - |
dc.contributor.localauthor | 이강운 | - |
dc.contributor.localauthor | Lee, Kang-Woon | - |
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