고집적 DRO FRAM 소자용 PZT 박막 캐패시터의 신뢰성 연구 = Reliability study in PZT thin film capacitors for high-density DRO FRAM devices

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Advisors
이원종researcherLee, Won-Jongresearcher
Description
한국과학기술원 : 재료공학과,
Publisher
한국과학기술원
Issue Date
2003
Identifier
181098/325007 / 000995255
Language
kor
Description

학위논문(박사) - 한국과학기술원 : 재료공학과, 2003.2, [ vi, 148 p. ]

Keywords

PZT; 강유전체; 신뢰성; FRAM; depolarization; size effect; imprint

URI
http://hdl.handle.net/10203/50293
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=181098&flag=dissertation
Appears in Collection
MS-Theses_Ph.D.(박사논문)
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