Sb 첨가를 통한 PZT박막의 electrical degradation mechanism에 관한 연구A study on the electrical degradation mechanism in PZT thin films by Sb addition
- Advisors
- 김호기researcher; Kim, Ho-Giresearcher
- Description
- 한국과학기술원 : 재료공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1998
- Identifier
- 143467/325007 / 000955393
- Language
- kor
- Description
학위논문(박사) - 한국과학기술원 : 재료공학과, 1998.8, [ iv, 135 p. ]
- Keywords
피로; 전기적 열화; d.c. 반응성 스퍼터링; PZT박막; PZT thin film; Fatigue; Electrical degradation; d.c. reactive sputtering
- Appears in Collection
- MS-Theses_Ph.D.(박사논문)
- Files in This Item
- There are no files associated with this item.
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