Dependability assessment of nuclear digital systems using function theory and fault injection experiment = 이산함수이론과 결함주입방법을 이용한 디지털 시스템의 신뢰도 평가에 관한 연구

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 281
  • Download : 0
The use of digital systems in nuclear instrument and control system (I&C) prevails because of their increased capability and superior performance compared with the analog systems. However, it is very difficult to evaluate the reliability of digital systems because they include the complex fault processing mechanisms at various levels of the systems. Software is another obstacle in reliability assessment of the systems that requires ultra-high reliability. There are ongoing debates in industry, academia, and the international standards community on the problem whether software reliability can be quantified or not. In addition, the reliability of digital systems has to be assessed considering software, hardware and SW/HW interactions because the software consideration cannot be fully understood apart from hardware considerations and vice versa. This work describes a combinatorial model for estimating the reliability of the embedded digital system by means of discrete function theory and software control flow. This model includes a coverage model for fault processing mechanisms implemented in digital systems. Furthermore, the model considers the interaction between hardware (H/W) and software (S/W). The fault processing mechanisms make it difficult for many types of components in digital system to be treated as binary state, good or bad. The discrete function theory provides a complete analysis of multi-state systems as which the digital systems can be regarded. Through adaptation of software control flow to discrete function theory, the HW/SW interaction is also considered for estimation of the reliability of digital system. In this work, the information on the coverage factor of fault tolerance mechanisms and software masking effects on hardware faults is obtained through fault injection experiments. Based on the Very High Speed Integrated Circuit (VHSIC) Hardware Description Language (VHDL), a simulation model for fault injection was developed. The informati...
Seong, Poong-Hyunresearcher성풍현researcher
한국과학기술원 : 원자력공학과,
Issue Date
169507/325007 / 000965407

학위논문(박사) - 한국과학기술원 : 원자력공학과, 2001.8, [ ix, 128 p. ]


Fault Injection; System; Digital; Dependability; Discrete Function; 이산함수; 결함주입; 시스템; 디지털; 신뢰도

Appears in Collection
Files in This Item
There are no files associated with this item.


  • mendeley


rss_1.0 rss_2.0 atom_1.0