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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Oxidation of Si during the growth of SiOx by ion-beam sputter deposition: In situ x-ray photoelectron spectroscopy as a function of oxygen partial pressure and deposition temperature Kim, Kyung Joong; Kim, Jeong Won; Yang, Moon-Seung; Shin, JungHoon, PHYSICAL REVIEW B, v.74, no.15, 2006-10 | |
| Effect of surface passivants on the photoluminescence from Si nanocrystals Yang, MS; Shin, JungHoon; Kim, KJ, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.48, pp.1291 - 1296, 2006-06 | |
| Cavity Q measurements of silica microspheres with nanocluster silicon active layer Sung, JY; Tewary, A; Brongersma, ML; Shin, JungHoon, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, v.12, pp.1388 - 1393, 2006-11 | |
| Large-scale fabrication of single-phase Er2SiO5 nanocrystal aggregates using Si nanowires Suh, Ki-Seok; Shin, Jung-Hoon; Seo, Seok-Jun; Bae, Byeong-Soo, APPLIED PHYSICS LETTERS, v.89, pp.1751 - 1759, 2006-11 |
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