Search
Results 1-1 of 1 (Search time: 0.005 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| In situ characterization of stoichiometry for the buried SiOx layers in SiOx/SiO2 superlattices and the effect on the photoluminescence property Kim, KJ; Moon, DW; Hong, SH; Choi, SH; Yang, MS; Jhe, JH; Shin, JungHoon, THIN SOLID FILMS, v.478, pp.21 - 24, 2005-05 |