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Results 1-6 of 6 (Search time: 0.002 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Oxidation of Si during the growth of SiOx by ion-beam sputter deposition: In situ x-ray photoelectron spectroscopy as a function of oxygen partial pressure and deposition temperature

Kim, Kyung Joong; Kim, Jeong Won; Yang, Moon-Seung; Shin, JungHoonresearcher, PHYSICAL REVIEW B, v.74, no.15, 2006-10

2
Extending the nanocluster-Si/erbium sensitization distance in Er-doped silicon nitride: The role of Er-Er energy migration

Kim, In Yong; Shin, JungHoonresearcher; Kim, Kyung Joong, APPLIED PHYSICS LETTERS, v.95, no.22, 2009-11

3
The characteristic carrier-Er interaction distance in Er-doped a-Si/SiO2 superlattices formed by ion sputtering

Ji-Hong Jhe; Shin, JungHoonresearcher; Kyung Joong Kim; Dae Won Moon, APPLIED PHYSICS LETTERS, v.82, no.25, pp.4489 - 4491, 2003-06

4
Exciton-erbium coupling and the excitation dynamics of Er3+ in erbium-doped silicon-rich silicon oxide

Seo, SY; Shin, JungHoonresearcher, APPLIED PHYSICS LETTERS, v.78, no.18, pp.2709 - 2711, 2001-04

5
Optical activation of Si nanowires by Er3+ doped binary Si-Al oxides films derived from sol-gel solutions

Ren, LL; Jeung, WY; Han, HC; Suh, K; Shin, JungHoonresearcher; Choi, HJ, OPTICAL MATERIALS, v.30, pp.497 - 501, 2007-11

6
Large-scale fabrication of single-phase Er2SiO5 nanocrystal aggregates using Si nanowires

Suh, Ki-Seok; Shin, Jung-Hoonresearcher; Seo, Seok-Jun; Bae, Byeong-Sooresearcher, APPLIED PHYSICS LETTERS, v.89, pp.1751 - 1759, 2006-11

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