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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Oxidation of Si during the growth of SiOx by ion-beam sputter deposition: In situ x-ray photoelectron spectroscopy as a function of oxygen partial pressure and deposition temperature Kim, Kyung Joong; Kim, Jeong Won; Yang, Moon-Seung; Shin, JungHoon, PHYSICAL REVIEW B, v.74, no.15, 2006-10 | |
Effect of hydrogenation on the memory properties of Si nanocrystals obtained by inductively coupled plasma chemical vapor deposition Young-Kwan Cha; Sangjin Park; Youngsoo Park; In-Kyeong Yoo; Daigil Cha; Shin, JungHoon; Suk-Ho Choi, APPLIED PHYSICS LETTERS, v.89, pp.1681 - 1688, 2006-11 | |
Large-scale fabrication of single-phase Er2SiO5 nanocrystal aggregates using Si nanowires Suh, Ki-Seok; Shin, Jung-Hoon; Seo, Seok-Jun; Bae, Byeong-Soo, APPLIED PHYSICS LETTERS, v.89, pp.1751 - 1759, 2006-11 |
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