Results 1-3 of 3 (Search time: 0.004 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
---|---|
Oxidation of Si during the growth of SiOx by ion-beam sputter deposition: In situ x-ray photoelectron spectroscopy as a function of oxygen partial pressure and deposition temperature Kim, Kyung Joong; Kim, Jeong Won; Yang, Moon-Seung; Shin, JungHoon, PHYSICAL REVIEW B, v.74, no.15, 2006-10 | |
Effect of surface passivants on the photoluminescence from Si nanocrystals Yang, MS; Shin, JungHoon; Kim, KJ, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.48, pp.1291 - 1296, 2006-06 | |
Cavity Q measurements of silica microspheres with nanocluster silicon active layer Sung, JY; Tewary, A; Brongersma, ML; Shin, JungHoon, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, v.12, pp.1388 - 1393, 2006-11 |
Discover