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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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In situ characterization of stoichiometry for the buried SiOx layers in SiOx/SiO2 superlattices and the effect on the photoluminescence property Kim, KJ; Moon, DW; Hong, SH; Choi, SH; Yang, MS; Jhe, JH; Shin, JungHoon, THIN SOLID FILMS, v.478, pp.21 - 24, 2005-05 |
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