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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Scanning Seebeck Microscope Simulations Bsed on the Heat and Electron Transport Lee, Eui-Sup; Kim, Yong-Hyun, 17th Asian Workshop on First-Principles Electronic Structure Calculations, Yonsei University, 2014-11-04 | |
| Detecting defects with thermoelectricity at the atomic scale Lee, Eui-Sup; Kim, Yong-Hyun; Yeo, Hogi; Cho, Sanghee, International Conference on Physics and Semiconductors (ICPS 2014), The University of TEXAS at Austin, 2014-08-12 | |
| Origin of Atomic Si Defects in Chemical Vapor Deposition Grown Graphene: Tetrahedral versus Planar Silicon Kim, Na Young; Le Viet Duc; Lee, Eui-Sup; Kim, Yong-Hyun, 제1회 한국 그래핀 심포지엄, 한국그래핀연구회, 2014-04-03 |
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