표면 감쇠파를 결합한 미소 공진구의 품위값 측정Direct measurement of microsphere cavity quality factors via evanescent-wave coupling
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 안경원 | - |
| dc.contributor.advisor | An, Kyung-Won | - |
| dc.contributor.author | 김선경 | - |
| dc.contributor.author | Kim, Sun-Kyung | - |
| dc.date.accessioned | 2011-12-14T07:56:36Z | - |
| dc.date.available | 2011-12-14T07:56:36Z | - |
| dc.date.issued | 2002 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=173517&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/48581 | - |
| dc.description | 학위논문(석사) - 한국과학기술원 : 물리학과, 2002.2, [ [iii], 45 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.subject | 미소 공진구 | - |
| dc.subject | 품위값 | - |
| dc.subject | 표면 감쇠파 | - |
| dc.subject | cavity | - |
| dc.subject | 결합 | - |
| dc.subject | microsphere | - |
| dc.subject | quality factor | - |
| dc.subject | evanescent field | - |
| dc.subject | coupling | - |
| dc.subject | 공진기 | - |
| dc.title | 표면 감쇠파를 결합한 미소 공진구의 품위값 측정 | - |
| dc.title.alternative | Direct measurement of microsphere cavity quality factors via evanescent-wave coupling | - |
| dc.type | Thesis(Master) | - |
| dc.identifier.CNRN | 173517/325007 | - |
| dc.description.department | 한국과학기술원 : 물리학과, | - |
| dc.identifier.uid | 020003082 | - |
| dc.contributor.localauthor | 김선경 | - |
| dc.contributor.localauthor | Kim, Sun-Kyung | - |
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- PH-Theses_Master(석사논문)
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