레이저 반사를 이용한 $A1_xGa_{1-x}As$ Bragg reflector 성장속도 측정 및 고온에서의 굴절률 보정In-Situ laserreflectometry applied to the growth of $A1_xGa_{1-x}As$ bragg reflectors by MOCVD, and calibration of refractive index at high temperature

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dc.contributor.advisor이용희-
dc.contributor.advisorLee, Yong-Hee-
dc.contributor.author신재헌-
dc.contributor.authorShin, Jae-Heon-
dc.date.accessioned2011-12-14T07:51:56Z-
dc.date.available2011-12-14T07:51:56Z-
dc.date.issued1993-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=68280&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/48292-
dc.description학위논문(석사) - 한국과학기술원 : 물리학과, 1993.2, [ [iii], 49 p. ]-
dc.languagekor-
dc.publisher한국과학기술원-
dc.title레이저 반사를 이용한 $A1_xGa_{1-x}As$ Bragg reflector 성장속도 측정 및 고온에서의 굴절률 보정-
dc.title.alternativeIn-Situ laserreflectometry applied to the growth of $A1_xGa_{1-x}As$ bragg reflectors by MOCVD, and calibration of refractive index at high temperature-
dc.typeThesis(Master)-
dc.identifier.CNRN68280/325007-
dc.description.department한국과학기술원 : 물리학과, -
dc.identifier.uid000911332-
dc.contributor.localauthor신재헌-
dc.contributor.localauthorShin, Jae-Heon-
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PH-Theses_Master(석사논문)
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