레이저 반사를 이용한 $A1_xGa_{1-x}As$ Bragg reflector 성장속도 측정 및 고온에서의 굴절률 보정 = In-Situ laserreflectometry applied to the growth of $A1_xGa_{1-x}As$ bragg reflectors by MOCVD, and calibration of refractive index at high temperature

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Advisors
이용희researcherLee, Yong-Heeresearcher
Description
한국과학기술원 : 물리학과,
Publisher
한국과학기술원
Issue Date
1993
Identifier
68280/325007 / 000911332
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 물리학과, 1993.2, [ [iii], 49 p. ]

URI
http://hdl.handle.net/10203/48292
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=68280&flag=dissertation
Appears in Collection
PH-Theses_Master(석사논문)
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